Automated EDF (Extended Depth of Field) Solution

1. What is EDF?

     In standard microscopy, higher magnification results in a shallower depth of field. This often causes samples with uneven surfaces to appear partially blurred. 

     EDF technology solves this by combining multiple images from different focal planes into a single, all-in-focus image.

2. How it Works (Z-Stacking)

• Image Layer Collection: Captures multiple images (Z-stack) at precise intervals from the bottom to the top of the sample.

• Pixel Sharpness Analysis: Our software analyzes each layer to extract only the highest-contrast and sharpest pixels.

• Digital Synthesis: These sharp pixels are merged into a single plane, creating a crisp result and enabling 3D topography modeling.

3. Key Applications

• Cleanliness Analysis (ISO 16232): Essential for capturing the full structure of 3D metallic chips or particles on membrane filters without measurement errors.

• PCB & Semiconductor Inspection: Ideal for observing structures with varying heights, such as soldering points or layered circuits.

• Metallurgical & Fracture Analysis: Allows for distortion-free observation of rough surfaces, metal fractures, and corroded areas.